Characterisation of 2D materials and heterostructures

Characterisation of 2D materials and heterostructures
Dr Tim Batten, Renishaw

Raman spectroscopy is a non-contact, non-destructive tool that provides sub-micrometre information on the vibrational, crystal and electronic structure of materials. It is the ideal tool for investigating 2D materials as it can be used to determine layer number, stress/strain and electronic properties. Recent advances in instrumentation at Renishaw have made characterisation of these materials easier and more comprehensive, adding features such as ultrafast mapping (>1000 spectra/s), low wavenumber filters and automatic sample focus tracking capabilities.

Here we present data highlighting some of the key capabilities of Renishaw’s inVia™ Raman microscope that make it the bestselling Raman system for understanding 2D materials. We will discuss LiveTrack™, a revolutionary Raman surface tracking technique that allows accurate Raman imaging of large, uneven samples, such as industrially grown graphene on metal foils. We also present data collected from ReS₂ (a transition metal dichalcogenide) using ultra-low frequency Eclipse filters, allowing straight forward determination of the thickness of ReS₂ flakes. Finally, we discuss polarisation Raman measurements that determine the orientation of ReS₂ flakes, the knowledge of which is vital when constructing 2D material heterostructures.

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